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IEEE 6th Intl. Board Test Workshop
(BTW07)

September 12-14, 2007
Fort Collins, CO

http://www.molesystems.com/BTW07

CALL FOR PAPERS & PARTICIPATION
Overview -- Submissions -- Additional Information -- Committees
Overview

Following the very successful 5th  Board Test Workshop (BTW) held in Fort Collins, the BTW Organizing Committee is organizing the sixth BTW event, which will be hosted by Intel in Fort Collins, Colorado.    BTW07 will focus on current issues and trends related to board test.  Similar to prior Board Test workshops, perspectives are invited from contract manufacturers, test equipment providers, researchers, end users and systems providers.

BTW07 is sponsored by the IEEE Computer Society - Test Technology Technical Council (TTTC) and supported by the IEEE Computer Society Board Test Technical Activities Committee (BTTAC)

We cordially invite you to participate and submit your contribution to BTW07, which includes (but is not limited to) the following topics:

  • Traditional Board Test Techniques
  • Boundary Scan-based test techniques
  • Assessing BSDL compliance and accuracy
  • Board test: structural versus functional test
  • Board Flex issues
  • Parametric testing
  • OnBoard Built-In Self Test techniques
  • Electrical, Optical and X-Ray board test mix
  • Board test for high-volume consumer products
  • Advances in flying probe technology
  • Creating board functional tests
  • Advances in ICT fixturing
  • Interfacing test flows with manufacturing flows
  • Board test: linking ICT with low-cost PC testers
  • Board test: fault-coverage metrics
  • Board test: reducing false fails
  • Applications of VXI/PXI plug ‘n play technology
  • In-System Configuration
  • OnBoard programmability of CPLDs/FPGAs
  • How to program PLDs to execute test functions
  • New Standards and New Problems
  • Practical use of P1581 SCITT
  • Advances in 1149.6 AC-EXTEST
  • Advances in 1149.4 Mixed-Signal test Bus
  • Test techniques for SERDES boards
  • Outsourcing to EMS companies
  • Outsourcing to EMSs – issues and solutions
  • Re-using prototype tests in volume manufacturing
  • At-speed board and system structural test
  • System-Level and Field-Service Test
  • Using 1149.1 as a backplane test-bus
  • 1149.1 backplane test-bus  support devices
  • Systems design integration and test issues
  • Field servicing: test needs and solutions
  • Board and System Test Economics
  • Board test economics
  • Emulation in a field-service environment
  • Board test: educational requirement

Submissions

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As with last year’s BTW, there will be three opportunities to participate (paper, presentation or short “Elevator talk”).  All attendees are encouraged to participate.  For papers and presentations, the Program Committee invites original submissions of at least 1,000 and at most 5,000 words focusing on new concepts and methodologies. Full paper submissions are preferred and recommended but the Program Committee will accept extended abstracts.  A one paragraph submission is required for Elevator Talks.

Electronic submission in Adobe PDF via the workshop submission web page is mandatory.   The web site  also informs about the review criteria. Please identify a contact author with complete information (mailing address, phone number, fax number and e-mail address).

Proceedings: Following the event, BTW07 will post presentations and papers from the accepted contributions whose authors wish to provide the corresponding materials on the BTW web site.

Submission deadline: July 20 , 2007
Acceptance Notification: August 10, 2007
Camera Ready: September 7, 2007

Additional Information
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To find out more about the IEEE Computer Society Board Test Technical Activities Committee (BTTAC), go to:  http://www.tttcdb.org/tttc_website/index.php?section=activities_board_test

Committees
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General Chair

Bill Eklow - Cisco Systems, Inc.

General Vice Chair

Ken Parker

Program Chair

Bill Eklow – Cisco Systems, Inc.

Program Vice Chair

Jay Njedlo - Intel

Publicity & Web Chair

Giorgio di Natale - LIRMM

Finance Chair

TBD

Academic Program Chair

Tony Ambler - Univ. Texas at Austin

Publications Chair

Ken Filliter – National Semiconductor

Local Arrangements Chair

Ken Parker – Agilent Technologies

For more information, visit us on the web at: http://www.molesystems.com/BTW07

IEEE 6th International Board Test Workshop (BTW07) is sponsored by the IEEE Computer Society TC on Test Technology and supported by the IEEE Computer Society Board Test Technical Activities Committee (BTTAC).


IEEE Computer Society- Test Technology Technical Council

TTTC CHAIR
André IVANOV
University of British Columbia - Canada
Tel. +1-604-822-6936
E-mail ivanov@ece.ubc.ca

SENIOR PAST CHAIR
Yervant ZORIAN
Virage Logic - USA
Tel. +1-510-360-8035
E-mail yervant.zorian@viragelogic.com

TTTC 2ND VICE CHAIR
Joan FIGUERAS
Universitat Politècnica de Catalunya - Spain
Tel. +34-93-401-6603
E-mail figueras@eel.upc.es

FINANCE
Adit D. SINGH
Auburn University - USA
Tel. +1-334-844-1847
E-mail adsingh@eng.auburn.edu

DESIGN & TEST MAGAZINE
Tim CHENG
University of California, Santa Barbara - USA
Tel. +1-805-893-72942
E-mail timcheng@ece.ucsb.edu

TECHNICAL MEETINGS
Chen-Huan CHIANG

Lucent Technologies
- USA
Tel. +1-732-949-5539
E-mail chenhuan@lucent.com

TECHNICAL ACTIVITIES
Victor Hugo CHAMPAC
Instituto Nacional de Astrofisica - Mexico
Tel.+52-22-470-517
E-mail champac@inaoep.mx

ASIA & SOUTH PACIFIC
Hideo FUJIWARA
Nara Institute of Science and Technology - Japan
Tel. +81-74-372-5220
E-mail fujiwara@is.aist-nara.ac.jp

LATIN AMERICA
Marcelo LUBASZEWSKI
Federal University of Rio Grande do Sul - Brazil
Tel. +34-93-401-6603
E-mail luba@vortex.ufrgs.br

NORTH AMERICA
William R. MANN
Tel. +1-949-645-3294
E-mail william.mann@ieee.org

COMMUNICATIONS
Adit D. SINGH
Auburn University - USA
Tel. +1-334-844-1847
E-mail adsingh@eng.auburn.edu

INDUSTRY ADVISORY BOARD
Yervant ZORIAN
Virage Logic - USA
Tel. +1-510-360-8035
E-mail yervant.zorian@viragelogic.com

 

PAST CHAIR
Paolo PRINETTO
Politecnico di Torino - Italy
Tel. +39-011-564-7007
E-mail Paolo.Prinetto@polito.it

TTTC 1ST VICE CHAIR
Adit D. SINGH
Auburn University - USA
Tel. +1-334-844-1847
E-mail adsingh@eng.auburn.edu

SECRETARY
Christian LANDRAULT
LIRMM - France
Tel. +33-4-674-18524
E-mail landrault@lirmm.fr

INTERNATIONAL TEST CONFERENCE
Jill E. SIBERT
Raspberry Comm.
- USA
Tel. +1-484-894-1111
E-mail jill_sibert@raspberrycom.com

TEST WEEK COORDINATION
Yervant ZORIAN
Virage Logic - USA
Tel. +1-510-360-8035
E-mail yervant.zorian@viragelogic.com

TUTORIALS AND EDUCATION
Dimitris GIZOPOULOS

University of Piraeus
- Greece
Tel. +30-210-414-2372
E-mail dgizop@unipi.gr

STANDARDS
Rohit KAPUR

Synopsys
- USA
Tel. +1-650-934-1487
E-mail rkapur@synopsys.com

EUROPE
Zebo PENG
Linköping University - Sweden
Tel. +46-13-282-067/-281-000
E-mail zpe@ida.liu.se

MIDDLE EAST & AFRICA
Ibrahim HAJJ
American University of Beirut - Lebanon
Tel. +961-1-341-952
E-mail ihajj@aub.edu.lb

STANDING COMMITTEES
Michael NICOLAIDIS
TIMA Laboratory - France
Tel. +33-4-765-74696
E-mail michael.nicolaidis@imag.fr

ELECTRONIC MEDIA
Alfredo BENSO
Politecnico di Torino - Italy
Tel. +39-011-564-7080
E-mail alfredo.benso@polito.it


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